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PIC Controller를 이용한 키패드 검사 시스템 개발

최광훈, 이영춘, 권대규, 이성철

Development of Keypad Test System using PIC Controller

Kwang-Hoon Choi, Young-Choon Lee, Tae-Kyu Kwon, Seong-Cheol Lee
JKSPE 2004;21(10):94-101.
Published online: October 1, 2004
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This paper presents the development of a keypad test system for the improvement of working environment and productivity using PICI6F877 microprocessor. In order to detect the fault of keypad products, hardware and software design is performed in this system. Keypad fault detection system is controlled by the 8 bit one chip PIC microcontroller for the exactness and speed. Developed panel of the keypad test system is comprised of the sub-panel for selecting in the inspected keypad types and the main panel for displaying the working order and fault position. Furthermore, all data from keypad inspection are stored in main memory of personal computer for the database. All these functions lead to the improvement of working speed and environment.

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Development of Keypad Test System using PIC Controller
J. Korean Soc. Precis. Eng.. 2004;21(10):94-101.   Published online October 1, 2004
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Development of Keypad Test System using PIC Controller
J. Korean Soc. Precis. Eng.. 2004;21(10):94-101.   Published online October 1, 2004
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