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Scanning Probe를 이용한 OMM(On the Machine Measuring) 시스템 개발 및 평가

김선호, 김인훈

The Development and Evaluation of OMM(On the Machine Measuring) System Using Scanning Probe

Sun Ho KIM, In Hoon KIM
JKSPE 1996;13(10):71-77.
Published online: October 1, 1996
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The Development and Evaluation of OMM(On the Machine Measuring) System Using Scanning Probe
J. Korean Soc. Precis. Eng.. 1996;13(10):71-77.   Published online October 1, 1996
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Development and Evaluation of OMM(On the Machine Measuring) System Using Scanning Probe
J. Korean Soc. Precis. Eng.. 1996;13(10):71-77.   Published online October 1, 1996
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